Keysight E6640A Bedienungsanleitung

V9065B

Sequence

Analyzer

Measurement

Guide

Keysight E6640A EXM Wireless Test Set

Notice: This document contains references to Agilent.

Please note that Agilent’s Test and Measurement

business has become Keysight Technologies. For

more information, go to www.keysight.com.

Notices

2009-2014

No part of this manual may be

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and retrieval or translation into a

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Keysight Technologies, Inc. as

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Trademark Acknowledgements

Bluetooth and the Bluetooth logos

are trademarks owned by Bluetooth

SIG, Inc., U.S.A. and licensed to

Keysight Technologies, Inc.

cdma2000 is a US registered

certification mark of the

Telecommunications Industry

Association.

LTE Logo and LTE-Advanced Logo

are trademarks of ETSI.

See:

http://www.3gpp.org/LTE-Logo-use

Manual Part Number

E6640-90012

Print Date

September 2014

Supersedes: N/A

Published in USA

Keysight Technologies Inc.

1400 Fountaingrove Parkway

Santa Rosa, CA 95403

Warranty

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Warranty

This Keysight technologies instrument product is warranted against defects in material and workmanship for a period of one

year from the date of shipment. During the warranty period, Keysight Technologies will, at its option, either repair or replace

products that prove to be defective.

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Where to Find the Latest Information

Documentation is updated periodically. For the latest information about these products, including instrument software

upgrades, application information, and product information, browse to one of the following URLs, according to the name of

your product:

http://www.keysight.com/find/e6640a

Information on preventing test set damage can be found at:

http://www.keysight.com/find/PreventingInstrumentRepair

Is your product software up-to-date?

Periodically, Keysight releases software updates to fix known defects and incorporate product enhancements. To search for

software updates for your product, go to the Keysight Technical Support website at:

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Contents

What is the Sequence Analyzer? 9

Sequence Analyzer Introduction 10

Example Sequence: Equally Spaced Analysis Intervals 15

Example Sequence: Variable Analysis Intervals 17

Sequence Setup 19

Analyzer List Sequencer Parameter Definitions 21

Analyzer Sequence 22

Acquisition Parameters 23

Analysis Interval Parameters 32

Source List Sequencer Parameter Definitions 37

Source Sequence 38

Source Parameters 39

Coordinating the Sequencers 45

Include Source in Sequence is enabled 46

Include Source in Sequence is disabled 50

Mode Parameters 55

Mode and Measurement Parameters 56

List Sequencer Global Parameters 69

Advanced Setup Parameters 72

Test Set Parameters 76

Save and Recall 79

Front Panel Sequence Setup 81

Front Panel List Sequencer Setup 82

Front panel source sequence setup 91

Saving a Sequence 93

Importing a tsv file into a spreadsheet 95

List Sequencer Spreadsheet Data Entry 97

Tab separated value file 98

Spreadsheet setup 99

TSV file generation 103

Loading a tsv file into the List Sequencer 104

Tab separated value file editing 105

Contents

List Sequencer Measurement Results 107

Sequence Analyzer measurement results 108

Sequence Setup Commands 115

Programming Analyzer Sequences (Combination Commands) 116

Programming Analyzer Sequences (Parameter-Specific Commands) 119

Programming Source Sequences (Combination Command) 135

Programming Source Sequences (Parameter-Specific Commands) 137

Programming a Sequence 141

Sequence Programming Example 142

Example Test Scenarios 151

Non-Signaling Test Requirements 152

Calibration Example 153

Verification Example 159

Basic Measurements Programming Commands 177

Basic Transmit Power 178

Basic Frequency and Phase Error 181

Basic Discrete PAvT 183

Basic IQ Data 185

GSM/EDGE Programming Commands 187

GSM/EDGE Programming 188

GMSK Phase and Frequency (PFER) 189

GSM Loopback BER 192

EDGE Power vs. Time (PvT) 193

EDGE Error Vector Magnitude (EVM) 196

EDGE Output RF Spectrum (ORFS) 201

EDGE Loopback BER 205

W-CDMA Programming Commands 207

Adjacent Channel Power (ACP) 208

Spectrum Emissions Mask (SEM) 212

Occupied Bandwidth (OBW) 215

Modulation Accuracy 216

QPSK EVM 220

Contents

Code Domain Power (CDP) 223

Phase Discontinuity 225

Loopback BER 228

cdma2000 Programming Commands 231

Adjacent Channel Power (ACP) 232

Spectrum Emissions Mask (SEM) 235

Occupied Bandwidth (OBW) 238

Modulation Accuracy 240

QPSK EVM 243

1xEV-DO Programming Commands 245

Adjacent Channel Power (ACP) 246

Spectrum Emissions Mask (SEM) 249

Occupied Bandwidth (OBW) 252

Modulation Accuracy (Rho) 253

LTE-FDD Programming Commands 259

Adjacent Channel Power (ACP) 260

Spectrum Emissions Mask (SEM) 263

Occupied Bandwidth (OBW) 266

CEVM 267

LTE-TDD Programming Commands 281

Power vs. Time (PvT) 282

Adjacent Channel Power (ACP) 286

Spectrum Emissions Mask (SEM) 289

Occupied Bandwidth (OBW) 292

CEVM 293

TD-SCDMA Programming Commands 307

Power vs. Time (PvT) 308

Adjacent Channel Power (ACP) 313

Spectrum Emissions Mask (SEM) 316

Occupied Bandwidth (OBW) 319

Modulation Accuracy (Rho) 320

QPSK EVM 323

Code Domain Power (CDP) 326

Contents

Loopback Bit Error Rate (BER) 328

Bluetooth Programming Commands 329

Adjacent Channel Power (ACP) 330

Occupied Bandwidth (OBW) 331

Modulation Accuracy (Transmit Analysis) 333

LE In-band Emission 336

EDR In-band Spurious Emission 338

WLAN Programming Commands 339

Spectrum Emissions Mask (SEM) 340

Occupied Bandwidth (OBW) 343

Modulation Accuracy (EVM & Spectral Flatness) 344

MIMO Modulation Accuracy (EVM) 348

Keysight E6640A

EXM Wireless Test Set

V9065B Sequence Analyzer Measurement Guide

1 What is the Sequence Analyzer?

This chapter provides a basic introduction to the Sequence Analyzer mode.

The chapter topics are:

Sequence Analyzer Introduction

Sequence Setup

What is the Sequence Analyzer?

Sequence Analyzer Introduction

The Sequence Analyzer mode makes it possible to define, save, and execute a series of data

acquisitions (controlled by the analyzer list sequencer) and/or a series of RF stimulus outputs

(controlled by the source list sequencer). This defined series of acquisitions and/or outputs is

known as a sequence.

The two list sequencers operate independently; however, they can exchange trigger signals with

one another, and they can both be controlled by the same sequence.

Figure 1-1 Source and Analyzer List Sequencers

Because one sequence can control both list sequencers, launching a sequence is all that is

necessary to cause the test set to (1) make a set of data acquisitions, (2) make measurements on

each acquisition, and (3) generate whatever RF stimulus is needed during each measurement.

Sequences are typically used in calibration and/or verification of a mobile device. The test set

generates the signals that are expected by the mobile device receiver, and analyzes the signals that

the mobile device transmits in response. This method of interacting with the mobile device saves

test time, because it does not involve any call processing (the test set and the mobile device only

need to exchange a predefined set of signals).

The Sequence Analyzer mode combines speed with flexibility. All of the actions controlled by the

sequence are executed rapidly and without interruption, even if the measurements involved use

different radio standards. (For example, it is possible to switch from an EDGE EVM measurement to

a W-CDMA SEM measurement without stopping the sequence and starting a new one.)

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