LANGER EMV-Technik E 1 Bedienungsanleitung

2016.08.15. E1 user manual

User manual

Immunity development system

E 1

How to make a DUT immune to interference

through measurement and modification at the development stage

Nöthnitzer Hang 31

01728 Bannewitz

10.04.2014

- 2 -

LANGER

EMV-Technik

DE-01728 Bannewitz

[email protected]

www.langer-emv.de

Table of contents: Page

1Description of the E1 immunity development system 3

2Description of the E1 components 4

2.1 SGZ 21 pulse density counter / burst generator 5

2.1.1 SGZ 21 as a disturbance generator 5

2.1.2 SGZ 21 as a pulse density counter 6

2.1.3 Preparing the SGZ 21 as a disturbance generator 6

2.1.4 Preparing the SGZ 21 as a pulse density counter and for signal monitoring 7

2.2 Field sources 8

2.2.1 Field sources for magnetic fields 8

2.2.2 Field sources for electric fields 9

2.2.3 Measurement set-up with SGZ 21 to inject burst current with field sources 11

2.3 Sensor 11

2.3.1 Principal mode of operation of the sensor 12

2.4 Magnetic field probes 13

3The pulse density method 14

4Prerequisites for interference suppression in a device under test 17

5Measurement strategies for interference suppression in a device under test 17

5.1 Analysis of the interference current paths 19

5.1.1 Basic principle of magnetic coupling –two-pole injection into the DUT 19

5.1.2 Basic principle of electric coupling –single-pole injection into the DUT 24

5.2 Localisation of weak points with field sources 26

5.2.1 Mechanism of action behind magnetic field coupling 27

5.2.2 Mechanism of action behind electric field coupling 28

5.2.3 Practical procedure for coupling with magnetic field sources 29

5.2.4 Practical procedure for coupling with electric field sources 34

5.3 Monitoring of logic signals from the device under test 39

5.3.1 Use of the pulse density method to evaluate immunity levels 40

5.3.2 Monitoring of logic signals from the device under test 41

5.4 Measurement of burst-related magnetic fields 42

6Safety instructions 44

7Warranty 44

8Technical specifications 45

9Scope of delivery 46

10 Optional components 47

10.1 S2 magnetic field probe set 47

10.2 Digital or analog optical signal transmission 48

- 3 -

LANGER

EMV-Technik

DE-01728 Bannewitz

[email protected]

www.langer-emv.de

1Description of the E1 immunity development system

The E1 immunity development system is an advanced tool for the electronics developer to examine the

immunity of modules to pulsed interference (burst/ESD) in experiments. The system allows him to analyse

the interference immunity in the confined space of a module. The selective injection of disturbance current

into individual sections (disturbance current paths) and application of pulsed electric (E fields) or magnetic

(H fields) fields to selected areas of the module's surface are decisive for the localisation of weak points.

While pulsed disturbances are applied to the device under test, the signals can be monitored

simultaneously via optical fibre without interaction.

The E1 immunity development system has been specially designed for the development process. It helps

the developer suppress interference in devices/modules or further harden them since it allows him to

clarify the immediate causes of immunity problems and test the effects of counter-measures directly.

The E1 immunity development system cannot be used for standard compliance tests. Testing a module's

immunity on the basis of the IEC 61000-4-4 and IEC 61000-4-2 standards, however, is an ideal starting point

for examining the device under test with the E1. The disturbances generated by the standard burst

generator in accordance with the standard are injected into the supply lines of the device under test and

flow back to the generator via ground. The paths on which the pulse-shaped disturbances flow through the

device module are not known. An unknown percentage of these disturbances encounters an unknown

victim in the device and generates a functional fault. This weak point can usually be pinpointed to a few

square centimetres of a module but can only be localised with difficulty in a standard compliance test. The

developer does not yet know if and where the disturbance current with its associated magnetic field

induces a voltage pulse in a conductor loop or couples electric field capacitively to sensitive lines.

Exact information about the fault pattern that has occurred is the decisive result of a failed compliance test.

But the fault pattern does not reveal precisely where the weak point of the device under test lies. A test in

accordance with the standard should thus initially be performed to determine the immunity of the device

under test so as to identify the fault pattern. The developer can then use the E1 at his workplace to analyse

the causes of the immunity problems, where the functional faults shown in the fault pattern provide a

certain orientation for interference suppression.

The immunity development system allows the developer to verify the effectiveness of EMC modifications

carried out in the interference suppression process immediately and thus to achieve a significant reduction

in the development time and development costs.

- 4 -

LANGER

EMV-Technik

DE-01728 Bannewitz

[email protected]

www.langer-emv.de

2Description of the E1 components

The E1 immunity development system comprises a SGZ 21 pulse density / burst generator, an S31 optical

sensor, an MS 02 magnetic field probe with optical fibre output, magnetic and electric field sources and

numerous accessories.

Figure 1: E1 hardware scope of delivery.

- 5 -

LANGER

EMV-Technik

DE-01728 Bannewitz

[email protected]

www.langer-emv.de

2.1 SGZ 21 pulse density counter / burst generator

The SGZ 21 (Figure 2) is a burst generator with potential-free pulse generation on the one hand, and on the

other hand the SGZ°21 is also a pulse density counter to measure the disturbance pulses of the device

under test.

Figure 2: SGZ 21 pulse density counter / burst generator.

Generator ON/OFF: to switch the SGZ 21 on or off

Intensity: potentiometer to gradually adjust the intensity of the disturbance pulses

Pulse shape: toggle switch to change between steep and flat pulses

Counter display: six-digit counter to measure the pulse density

SIGNAL LED display: to indicate the received light signal

SPIKE LED display: to indicate the received light signal with pulse trap; the pulse is stretched to a visible

width of 50 ms

Burst output: symmetric output galvanically isolated from ground

Counter's optical fibre input: input socket for 2.2 mm plastic optical fibre

The power supply is located on the left side of the generator. A 12 V power supply unit is included in the

scope of delivery.

2.1.1 SGZ 21 as a disturbance generator

The SGZ 21 generates potential-free, pulse-shaped disturbances whose edges have a rise time of approx.

2 ns and a fall time of approx. 10 ns. In contrast, a standard generator generates pulse shapes of 5/50 ns.

The SGZ 21's smaller pulse width prevents the device under test from being destroyed. Furthermore,

working at a lower disturbance voltage level ensures greater safety for the engineer.

The SGZ 21 allows partial injection into structural parts, cables, shielding, earth connections and primarily

directly into the modules. The disturbance current of the SGZ 21 is generated via a differential output.

Consequently, the generated pulsed current does not relate to the generator housing potential.

- 6 -

LANGER

EMV-Technik

DE-01728 Bannewitz

[email protected]

www.langer-emv.de

The path that the disturbance current takes through the device under test can be defined by contacting the

device under test accordingly. Disturbance current can thus be injected into defined sections of the module

without significantly influencing the environment.

The peak values of the disturbance pulses are between 0 and 1500 volt. They are constantly changed but

are stochastically evenly distributed.

-The SGZ 21 has a symmetric output that is galvanically isolated from ground. The disturbance pulses are

coupled out capacitively with alternating polarity.

-The pulse shape toggle switch of the SGZ 21 can be used to change over between steep and flat pulses

to adjust the disturbance effect.

2.1.2 SGZ 21 as a pulse density counter

A counter with an optical input (2.2 mm plastic optical fibre) is integrated in the SGZ 21 (Figure 2). A sensor

that is located in the device under test (Chapter 0) or a magnetic field probe transmits light pulses to the

SGZ 21 counter via an optical fibre and the optical input. The received light pulses are initially displayed by

the "Signal" and the "Spike" LEDs and then counted by the counter. The counter's peak time is 1 s.

Using the pulse density method (Chapter 3) allows a very fast assessment of the sensitivity of a device

under test.

The SGZ 21 can be operated standing perpendicular on its rear so that you can easily read the counter from

above –e.g. when working standing up.

2.1.3 Preparing the SGZ 21 as a disturbance generator

Generator cables and connecting terminals are needed to operate the SGZ 21 as a disturbance generator.

The generator cables are connected to the SGZ 21 output sockets via the 4 mm plug (banana plug). The

generator cables (Figure 3) end in two-pole 0.64 mm plug pins. Both pins are connected to the core of the

cable. Only one plug pin of each generator cable is used to connect the 250 mm long extension cable

(Figure 5).

The connection to the device under test is via alligator clips or micro-kleps (miniature clamp-type test

probes with rotating grip jaws) (Figure 4). The field sources contained in the E1 system can be connected

directly to the extension cables as required.

Figure 3: Generator cables (bottom); two extension cables (top).

- 7 -

LANGER

EMV-Technik

DE-01728 Bannewitz

[email protected]

www.langer-emv.de

Figure 4: Alligator clips on the left and micro-kleps on the right.

2.1.4 Preparing the SGZ 21 as a pulse density counter and for signal monitoring

The optical fibre has to be inserted into the input up to the limit stop and fastened with the knurled screw

(Figure 6).

Figure 6: Optical fibre connection on the SGZ 21.

Figure 5: SGZ 21 with generator cables plus an alligator clip and a micro-klep.

- 8 -

LANGER

EMV-Technik

DE-01728 Bannewitz

[email protected]

www.langer-emv.de

2.2 Field sources

The field sources are supplied with disturbance current from the SGZ 21 and generate either pulsed

magnetic or electric fields depending on the type of field source used. The field intensities of these pulsed

fields are comparable to those generated by burst currents on the surface of modules during standard

compliance tests. The field sources can be used to subject small areas of the device under test or individual

conductor runs to defined disturbances.

The field sources contained in the E1 system are optimised so that they generate either a magnetic field or

an electric field. Furthermore, the field sources are of different sizes, allowing the developer to apply the

pulsed field to differently dimensioned areas on the module. In addition, there are special field sources for

specific tasks such as magnetic field sources that couple to conductors via a specially shaped field.

Different types of probe heads are offered that are designed for certain measurement tasks. They allow the

developer to pinpoint weak points to the millimetre or to search for critical links and connections such as

components, conductor runs or IC pins on the defined interference path. The sensitivity of different IC pins

can be assessed. Following localisation, the sensitive areas can be treated in a specific way.

E-field-sensitive weak points cannot be identified with H-field sources. Special E-field probes have to be

used to localise these weak points. Apart from conductor run sections, high-resistance components such as

pull-up resistors or quartz generators may also prove critical in this respect.

2.2.1 Field sources for magnetic fields

The E1 contains four field sources which are able to generate magnetic fields. Thanks to the probe head's

various designs, two types of measurements can be performed:

a) Determination of an IC pin's / conductor's sensitivity irrespective of whether a layout-related disturbance

is conducted to the IC. This measurement provides the developer with an overview of which IC pins and/or

conductor runs are sensitive in general.

b) Localisation of weak points in the layout

The disturbance fields applied from outside during the standard compliance test couple to the module's

conductor runs at weak points in the layout. The disturbances are passed on to the IC via the conductor

runs. The disturbance process triggered by the standard compliance test on the module is generally due to

electric and magnetic field coupling. The E1 system contains field sources which have been custom-

developed to simulate these field coupling phenomena for fault localisation.

Field pattern

Use

Design

BS 02 is a field source to localise weak points in the layout. The

magnetic field source produces a B-field line bundle with a

diameter of > 5 cm. It is suitable for investigations on both

devices and modules. The size of the probe allows the developer

to apply the field to large areas of housing surfaces and inner

spaces, connecting elements and modules with conducting

structures as well as ICs to identify weak points that are sensitive

to magnetic fields.

- 9 -

LANGER

EMV-Technik

DE-01728 Bannewitz

[email protected]

www.langer-emv.de

BS 04DB is a field source to localise weak points in the layout. It

generates a B-field line bundle in the millimetre range

(approx. 3 mm). The field beam emerging from the probe's face

can be used to scan the surface of circuit boards and resolve

magnetically sensitive weak points in small spaces of 3 mm in the

field of layout and packaging. The BS°04DB allows the localisation

of critical conductor run sections, components and component

connections.

BS 05D is a field source to localise weak points in the layout. The

magnetic field source generates a B-field line bundle with a

diameter of approx. 3 mm similar to the BS 04 DB. But the field

lines are at an angle of 90° to the probe shaft. The probe is thus

ideal to localise weak points between two printed circuit boards

or in hard-to-reach locations of modules between components,

for example. Before using the BS 05D field probe, the weak point

should be roughly narrowed down with the BS 02 or BS 04DB

probe.

BS 05DU is a field source that can be used to determine an

individual IC pin's/conductor's sensitivity. The magnetic field source

generates a circular magnetic field in the millimetre range. It can

also be used as a mini coupling clamp to couple disturbance current

into selected individual conductor runs, IC pins, SMD devices and

thin lines (ribbon cable).

A module often has several insensitive and only a few sensitive

signal connections (conductor runs, IC pins). The field source is

the ideal tool to quickly identify the sensitive ones and carry out

appropriate layout modifications.

2.2.2 Field sources for electric fields

The E1 contains five field sources which are able to generate electric fields. Thanks to the probe head's

various designs, two types of measurements can be performed:

a) Determination of an IC pin's/conductor's sensitivity

b) Localisation of weak points in the layout

The size of the coupling electrode in the probe head is the field sources' distinguishing feature.

ES 08D is a probe tip that can be used to determine an

individual IC pin's/conductor's sensitivity. A galvanic isolating

point with capacitive coupling of approx. 1 pF is contained in

the probe tip which is ideal for very small structures. The

pin/conductor run is contacted with the probe tip and its

sensitivity determined by changing the intensity on the

SGZ 21 ("Intensity" controller) in the test. The field source has

to be connected via two poles. One conductor is connected to

the probe tip via a coupling capacitance of 1 pF. The second

conductor is connected to a counter-electrode, preventing

disturbance current from flowing through the device under

test unintentionally and thus affecting other areas.

Connection: two-pole

- 10 -

LANGER

EMV-Technik

DE-01728 Bannewitz

[email protected]

www.langer-emv.de

ES 05D is a field source that can be used to determine the

sensitivity of an IC pin/conductor or individual components.

The E-field source has a narrow line-shaped coupling

electrode in its probe head. This design makes it ideal for

being placed on conductor runs and small components and

their connections, wires and individual SMD components such

as resistors and capacitors. Individual plug contacts or cores

of ribbon cables can also be examined. The probe is placed on

the component/conductor run to inject the E-field.

Connection: two-pole

ES 02 is a field source to localise weak points in the layout.

The size of the field source allows the developer to couple the

field to large areas of housing surfaces and inner spaces,

connecting elements and components with conducting

structures and ICs (e.g. bus systems, LCD displays). The tip of

the E-field source can be used to localise small weak points

that are sensitive to E-field (conductor runs, quartz crystal

oscillators, pull-up resistors, ICs).

Connection: two-pole

ES 01 is a field source to localise weak points in the layout.

The field source allows electric coupling to large areas. The

probe is ideal for applying an electric field to extensive or

line-shaped weak points with a size of 5 to 10 cm and ranks

between the ES 02 and ES 00 field sources (please refer to the

corresponding description). The ES 02 may be too small and

the ES 00 source too large for certain purposes. The ES 01 can

also be used to couple disturbance current to a module. The

intensity of the disturbance current can be controlled by the

distance between the probe and the module.

Connection: single-pole

ES 00 is a field source to localise weak points in the layout.

The field source allows electric coupling to large-area or line-

shaped structures (150 cm²). Electrically sensitive weak points

often extend over large areas from 10 to 15 cm of a module

(LCD display, bus systems). These weak points do not respond

to small field sources. Large-area field sources such as the

ES 00 are needed to identify this type of weak points. The

source can also be used for coupling to housings. The ES 00

can also be used to couple disturbance current to a module.

The intensity of the disturbance current can be controlled by

the distance between the probe and the module.

Connection: single-pole

Key to designations

Example: BS 04 DB

Type of field

Size

Attenuation

Special field shape

BS Field source for magnetic

field

ES Field source for electric

field

DCommon-mode

attenuation

BBundled field lines

UCircular field

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