Murata GRM155D71A225ME15 Series Bedienungsanleitung

GRM155D71A225ME15_ (0402, X7T:EIA, 2.2uF, DC10V)

_: packaging code Reference Sheet

1.Scope

2.MURATA Part NO. System

(Ex.)

3. Type & Dimensions

(Unit:mm)

4.Rated value

5.Package

Product specifications in this catalog are as of Mar.5,2016,and are subject to change or obsolescence without notice.

Please consult the approval sheet before ordering.

Please read rating and !Cautions first.

(3) Temperature Characteristics

(Public STD Code):X7T(EIA)

0.15 to 0.35

(5) Nominal

Capacitance

mark

(4)

Rated

Voltage

Packaging Unit

DC 10 V

Temp. Range

(Ref.Temp.)

(8) Packaging

-33 to 22 %

-55 to 125 °C

(25 °C)

0.3 min.

(1)-1 L

1.0±0.2

(1)-2 W

0.5±0.2

This product specification is applied to Chip Monolithic Ceramic Capacitor used for General Electronic equipment.

(2) T

Chip Monolithic Ceramic Capacitor for General

Specifications and Test

Methods

(Operating

Temp. Range)

Temp. coeff

or　Cap. Change

±20 %

(6)

Capacitance

Tolerance

2.2 uF

0.5±0.05

-55 to 125 °C

f180mm Reel

PAPER W8P2

10000 pcs./Reel

f330mm Reel

PAPER W8P2

50000 pcs./Reel

(1)L/W

Dimensions

(2)T

Dimensions

(3)Temperature

Characteristics

(4)Rated

Voltage

(5)Nominal

Capacitance

(6)Capacitance

Tolerance

(8)Packaging

Code



Control Code

GRM 15 5D7 1A 225 M E15 D

GRM155D71A225ME15-01 1

■Specifications and Test Methods

1 Rated Voltage Shown in Rated value. The rated voltage is defined as the maximum voltage which may be

applied continuously to the capacitor.

When AC voltage is superimposed on DC voltage, VP-P or VO-P,

whichever is larger, should be maintained within the rated voltage

range.

2 Appearance No defects or abnormalities. Visual inspection.

3 Dimension Within the specified dimensions. Using calipers. (GRM02 size is based on Microscope)

4 Voltage proof No defects or abnormalities.

Measurement Point　　 :

Between the terminations

Test Voltage 　　　　　　 :

250% of the rated voltage

Applied Time :

1 to 5 s

Charge/discharge current :

50mA max.

5 Insulation Resistance(I.R.) 

Measurement Point 　　: Between the terminations

Measurement Voltage :

DC Rated Voltage

Charging Time :

1 min

Charge/discharge current :

50mA max.

Measurement Temperature :

Room Temperature

6 Capacitance Shown in Rated value.

Measurement Temperature :

Room Temperature

7 Dissipation Factor (D.F.) B1,R1,B3,R6,R7,C6,C7,C8,E7,D7 : 0.1 max.

D8,GRM31CR60J107 : 0.15 max

GRM31CR71E106 : 0.125

max

*1 For items listed in Table 1 on the left, the capacitance should

be measured using a voltage of 0.5+/-0.1Vrms instead of

1.0+/-0.2Vrms.

*2 For item GRM188R70J105, the capacitance should be measured

using a voltage of 1.0+/-0.2Vrms instead of 0.5+/-0.1Vrms.

Temperature No bias B1,B3 : Within +/-10% (-25°C to +85°C) The capacitance change should be measured after 5 min.

Characteristics R1,R7 : Within +/-15% (-55°C to +125°C) at each specified temp. stage.

of Capacitance R6 : Within +/-15% (-55°C to +85°C) In case of applying voltage, the capacitance change should be

C6 : Within +/-22% (-55°C to +85°C) measured after 1 min. with applying voltage in equilibration of

C7 : Within+/-22% (-55°C to +125°C) each temp. stage.

C8 : Within +/-22% (-55°C to +105°C) Capacitance value as a reference is the value in step 3.

E7 : Within +22/-56% (-55°C to +125°C)

D7 : Within +22/-33% (-55°C to +125°C) · Measurement Voltage : 0.20+/-0.05Vrms

D8 : Within +22/-33% (-55°C to +105°C)

50% of B1: Within +10/-30%

the rated R1: Within +15/-40%

voltage

･Initial measurement

Perform a heat treatment at 150+0/-10°C for 1h and then

let sit for 24+/-2h at room temperature,then measure.

9 Adhesive Strength No removal of the terminations or other defect Solder the capacitor on the test substrate shown in Fig.3.

of Termination should occur.

Holding Time : 10+/-1s

Applied Direction : In parallel with the test substrate and vertical with the

capacitor side.

Item

Specification

Test Method

(Ref. Standard:JIS C 5101, IEC60384）

Type Applied Force(N)

GRM02 1

GRM03 2

GRM15/GRM18 5

GRM21/GRM31/GRM32 10

Solder Resist

Chip Capacitor

Land

These Part Numbers are designed for use in the circuits where

continuous applied voltage to the capacitor is derated than rated

voltage, and guarantee Durability Test with 100% × rated voltage

as testing voltage at the maximumoperating temperature.

The voltage and temperature derating conditions on the left are

recommended for use to ensure the same reliability level as

normal specification.

Step

Temperature(C)

Applying Voltage(VDC)

Reference Temp.+/-2

No bias

Min.Operating Temp. +/-3

Reference Temp. +/-2

Max.Operating Temp. +/-3

Reference Temp. +/-2

50% of

the rated voltage

(For B1,R1)

Min.Operating Temp. +/-3

Reference Temp. +/-2

Max.Operating Temp.+/-3

*Table 1

GRM033 B3/R6 1A 123 to 823

GRM033 B3/R6 1A104

GRM033 R6 1A224

GRM153 B3/R6 1A105

GRM155 B3/R6 1A124 to 105

GRM155 B3/R6 1A225

GRM185 B3/R6 1C/1A105

GRM185 C8/D7 1A105

GRM188 B3/R6 1C/1A225

GRM188 R7/C8/D7 1A 225

GRM188 B3/R6 1A335

GRM219 B3/R6 1C/1A475

GRM219 C8 1A 475

GRM219 B3/R6 1A106

GRM21B B3/R6 1C/1A 106

GRM21B R7/C8 1A 106

GRM319 B3/R6 1C/1A106

Capacitance

Frequency

Voltage

*1 C≦

(10V min.)

1.0+/-0.1kHz

1.0+/-0.2Vrms

*2 C≦

(6.3V max.)

1.0+/-0.1kHz

0.5+/-0.1Vrms

C＞

120+/-24Hz

0.5+/-0.1Vrms

JEMCGS-01735C 2

10 Vibration  Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3.

Capacitance Within the specified initial value.

Kind of Vibration :

A simple harmonic motion

D.F. Within the specified initial value. 10Hz to 55Hz to 10Hz (1min)

Total amplitude :

1.5mm

This motion should be applied for a period of 2h in each 3 mutually

perpendicular directions(total of 6h).

11 Substrate Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.1.

Bending test

Capacitance Within +/-10% Pressurization method : Shown in Fig.2

Change Flexure　　　　: 1mm

Holding Time 　 :

5+/-1s

Soldering Method :

Reflow soldering

12 Solderability 95% of the terminations is to be soldered evenly and

Test Method :

Solder bath method

continuously. Flux Solution of rojin ethanol 25(wt)%

Preheat :

80℃to 120℃for 10s to 30s

Solder : Sn-3.0Ag-0.5Cu

Solder Temp. :

245+/-5℃

Immersion time

2+/-0.5s

Resistance Appearance No defects or abnormalities. <GRM03 size min.>

to Test Method : Solder bath method

Soldering Solder : Sn-3.0Ag-0.5Cu

Heat Solder Temp. :

270+/-5℃

Immersion time

10+/-0.5s

Capacitance Within +/-15% Exposure Time : 24+/-2h

Change Preheat : GRM31 size max.: 120℃to 150℃for 1 min

　GRM32 size　　　 : 100℃to 120℃for 1 min

and 170℃to 200℃for 1 min

· Initial measurement

D.F. Within the specified initial value. Perform a heat treatment at 150+0/-10°C for 1h and then

let sit for 24+/-2h at room temperature,then measure.

Test Method : Reflow soldering (hot plate)

I.R. Within the specified initial value. Solder : Sn-3.0Ag-0.5Cu

Solder Temp. :

270+/-5℃

Reflow Time : 10+/-0.5s

Test Substrate : Glass epoxy PCB

Voltage proof No defects. Exposure Time : 24+/-2h

Preheat :

120℃to 150℃for 1 min

· Initial measurement

Perform a heat treatment at 150+0/-10°C for 1h and then

let sit for 24+/-2h at room temperature,then measure.

Temperature Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3.

Sudden Change Perform the five cycles according to the four heat treatments

shown in the following table.

Capacitance B1,R1,B3,R6,R7,C6,C7,C8,D7,D8 : Within +/-7.5%

Change E7 : Within +/-30%

D.F. Within the specified initial value.

I.R. Within the specified initial value. Exposure Time : 24+/-2h

· Initial measurement

Voltage proof No defects. Perform a heat treatment at 150+0/-10°C for 1h and then

let sit for 24+/-2h at room temperature,then measure.

·GRM188B30J106M Measurement after test:

Perform a heat treatment at 150+0/-10°C for 1h and then

let sit for 24+/-2h at room temperature,then measure.

15 High Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3.

Temperature

Test Temperature :

40+/-2℃

High

Test Humidity :

90%RH to 95%RH

Humidity Capacitance Within +/-12.5%

Test Time :

500+/-12h

(Steady) Change

Applied Voltage :

DC Rated Voltage

Charge/discharge current : 50mA max.

D.F. 0.2 max.

Exposure Time :

24+/-2h

· Initial measurement

I.R.

∙F Perform a heat treatment at 150+0/-10°C for 1h and then

let sit for 24+/-2h at room temperature,then measure.

· Measurement after test

Perform a heat treatment at 150+0/-10°C for 1h and then

let sit for 24+/-2h at room temperature,then measure.

Item

Specification

Test Method

(Ref. Standard:JIS C 5101, IEC60384）

Type Applied Force(N)

GRM02 1

GRM03 2

GRM15/GRM18 5

GRM21/GRM31/GRM32 10

Solder Resist

Chip Capacitor

Land

These Part Numbers are designed for use in the circuits w here

continuous applied voltage to the capacitor is derated than rated

voltage, and guarantee Durability Test with 100% × rated voltage

as testing voltage at the maximumoperating temperature.

The voltage and temperature derating conditions on the left are

recommended for use to ensure the same reliability level as

normal specification.

Step

Temp.(C)

Time

(min)

Min.Operating Temp.+0/-3

30+/-3

Room Temp

2 to 3

Max.Operating Temp.+3/-0

30+/-3

Room Temp

2 to 3

JEMCGS-01735C 3

16 Durability Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3.

Test Temperature :

Max. Operating Temp. +/-3℃

Capacitance Within +/-12.5%

Test Time :

1000+/-12h

Change

Applied Voltage :

100% of the rated voltage

Charge/discharge current : 50mA max.

Exposure Time :

24+/-2h

D.F. 0.2 max. · Initial measurement

Perform a heat treatment at 150+0/-10°C for 1h and then

let sit for 24+/-2h at room temperature,then measure.

I.R.  · Measurement after test

Perform a heat treatment at 150+0/-10°C for 1h and then

let sit for 24+/-2h at room temperature,then measure.

Recommended derating conditions on voltage and temperature

Item

Specification

Test Method

(Ref. Standard:JIS C 5101, IEC60384）

Type Applied Force(N)

GRM02 1

GRM03 2

GRM15/GRM18 5

GRM21/GRM31/GRM32 10

Solder Resist

Chip Capacitor

Land

These Part Numbers are designed for use in the circuits w here

continuous applied voltage to the capacitor is derated than rated

voltage, and guarantee Durability Test with 100% × rated voltage

as testing voltage at the maximumoperating temperature.

The voltage and temperature derating conditions on the left are

recommended for use to ensure the same reliability level as

normal specification.

JEMCGS-01735C 4

Test method : Substrate Bending test

・Test substrate

Material : Copper-clad laminated sheets for PCBs

(Glass fabric base, epoxy resin)

Thickness : 1.6mm (GRM02/GRM03/GRM15: t:0.8mm)

Copper foil thickness : 0.035mm

: Solder resist

(Coat with heat resistant resin for solder)

Fig.1 (in mm)

・Kind of Solder : Sn-3.0Ag-0.5Cu

・Pressurization method

Fig.2 (in mm)

Adhesive Strength of Termination, Vibration, Temperature Sudden Change, Resistance to Soldering Heat (Reflow method)

High Temperature High Humidity(Steady) , Durability

・Test substrate

Material : Copper-clad laminated sheets for PCBs

(Glass fabric base, epoxy resin)

Thickness : 1.6mm or 0.8mm

Copper foil thickness : 0.035mm

・Kind of Solder : Sn-3.0Ag-0.5Cu

・Land Dimensions

　Fig.3

Type Applied Force(N)

GRM02 1

GRM03 2

GRM15/GRM18 5

GRM21/GRM31/GRM32 10

Solder Resist

Chip Capacitor

Land

These Part Numbers are designed for use in the circuits w here

continuous applied voltage to the capacitor is derated than rated

voltage, and guarantee Durability Test with 100% × rated voltage

as testing voltage at the maximumoperating temperature.

The voltage and temperature derating conditions on the left are

recommended for use to ensure the same reliability level as

normal specification.

＊2

4.0±0.1

8.0±0.3

3.5±0.05

0.05以下

＊1

φ1.5

+0.1

-0

Ａ

*1,2：2.0±0.05

1.75±0.1

Ｂ

100

Land

f4.5

Type

Dimension (mm)

GRM02

0.2

0.56

0.23

GRM03

0.3

0.9

0.3

GRM15

0.4

1.5

0.5

GRM18

1.0

3.0

1.2

GRM21

1.2

4.0

1.65

GRM31

2.2

5.0

2.0

GRM32

2.2

5.0

2.9

Flexure

Capacitance meter

Pressurization

speed

1.0mm/s

Support

Capacitor

Pressurize

50 min.

Type

Dimension (mm)

GRM02

0.2

0.56

0.23

GRM03

0.3

0.9

0.3

GRM15

0.4

1.5

0.5

GRM18

1.0

3.0

1.2

GRM21

1.2

4.0

1.65

GRM31

2.2

5.0

2.0

GRM32

2.2

5.0

2.9

JEMCGS-01735C 5

1.Tape Carrier Packaging(Packaging Code:D/J)

1.1 Minimum Quantity(pcs./reel)

1.2 Dimensions of Tape

(1)GRM15 (in mm)

Code

A *3

B *3 *3 Nominal value

ｔ

*3 Nominal value

Package

GRM Type

Type

Paper Tape

Code:J

GRM155

(Dimensions Tolerance:±0.2)

GRM155

(Dimensions Tolerance:±0.2)

0.75

50000

1.35

0.8 max.

Code:D

10000





*1,2：2.0±0.05

＊2

4.0±0.1

8.0±0.3

3.5±0.05

0.05以下

＊1

φ1.5

+0.1

-0

Ａ

*1,2：2.0±0.05

1.75±0.1

Ｂ

4.0±0.1

φ1.5

+0.1

-0

1.75±0.1

8.0±0.3

3.5±0.05

Ａ

Ｂ

0.05 max.

JEMCGP-02543 6

Package

GRM Type

図

ﾁｯﾌﾟ詰め状態

(

単位：

mm)



ｗ1

Top Tape : Thickness 0.06

Feeding Hole :As specified in 1.2.

Hole for Chip : As specified in 1.2.

Base Tape : As specified in 1.2.

Bottom Tape :Thickness 0.05

(Only a bottom tape existence )

16.5 max.

10±1.5

-3.0



 min.



2.0±0.5

Chip

(in:mm)

Fig.1 Package Chips

Fig.2 Dimensions of Reel

Fig.3 Taping Diagram

JEMCGP-02543 7

1.3 Tapes for capacitors are wound clockwise shown in Fig.3.

(The sprocket holes are to the right as the tape is pulled toward the user.)

1.4 Part of the leader and part of the vacant section are attached as follows.

(in:mm)

1.5 Accumulate pitch : 10 of sprocket holes pitch = 40±0.3mm

1.6 Chip in the tape is enclosed by top tape and bottom tape as shown in Fig.1.

1.7 The top tape and base tape are not attached at the end of the tape for a minimum of 5 pitches.

1.8 There are no jointing for top tape and bottom tape.

1.9 There are no fuzz in the cavity.

1.10 Break down force of top tape : 5N min.

Break down force of bottom tape : 5N min. (Only a bottom tape existence )

1.11 Reel is made by resin and appeaser and dimension is shown in Fig 2.

There are possibly to change the material and dimension due to some impairment.

1.12 Peeling off force : 0.1N to 0.6N*in the direction as shown below.

1.13 Label that show the customer parts number, our parts number, our company name, inspection

number and quantity, will be put in outside of reel.

Package

GRM Type

図

ﾁｯﾌﾟ詰め状態

(

単位：

mm)

Tail vacant Section

Chip-mounting Unit

Leader vacant Section

Leader Unit

(Top Tape only)

Direction

of Feed

160 min.

190 min.

210 min.

図

ﾁｯﾌﾟ詰め状態

(

単位：

mm)

165～180°

Top tape

JEMCGP-02543 8

Caution

■Limitation of Applications

Please contact us before using our products for the applications listed below which require especially high reliability

　for the prevention of defects which might directly cause damage to the third party's life, body or property.

　　　①Aircraft equipment ②Aerospace equipment ③Undersea equipment ④Power plant control equipment

　　　⑤Medical equipment ⑥Transportation equipment(vehicles,trains,ships,etc.) ⑦Traffic signal equipment

　　　⑧Disaster prevention / crime prevention equipment ⑨Data-processing equipment

　　　⑩Application of similar complexity and/or reliability requirements to the applications listed in the above.

■Storage and Operation condition

1. The performance of chip monolithic ceramic capacitors may be affected by the storage conditions.

1-1. Store the capacitors in the following conditions:

Room Temperature of +5℃to +40℃and a Relative Humidity of 20% to 70%.

(1) Sunlight, dust, rapid temperature changes, corrosive gas atmosphere, or high temperature and humidity

conditions during storage may affect solderability and packaging performance.

Therefore, please maintain the storage temperature and humidity. Use the product within six months,

as prolonged storage may cause oxidation of the terminations (outer electrodes).

(2) Please confirm solderability before using after six months.

Store the capacitors without opening the original bag.

Even if the storage period is short, do not exceed the specified atmospheric conditions.

1-2. Corrosive gas can react with the termination (external) electrodes or lead wires of capacitors, and result

in poor solderability. Do not store the capacitors in an atmosphere consisting of corrosive gas (e.g.,hydrogen

sulfide, sulfur dioxide, chlorine, ammonia gas etc.).

1-3. Due to moisture condensation caused by rapid humidity changes, or the photochemical change caused

by direct sunlight on the terminal electrodes and/or the resin/epoxy coatings, the solderability and

electrical performance may deteriorate. Do not store capacitors under direct sunlight or in high huimidity

conditions

■Rating

1.Temperature Dependent Characteristics

1. The electrical characteristics of the capacitor can change with temperature.

1-1. For capacitors having larger temperature dependency, the capacitance may change with temperature

changes. The following actions are recommended in order to ensure suitable capacitance values.

(1) Select a suitable capacitance for the operating temperature range.

(2) The capacitance may change within the rated temperature.

When you use a high dielectric constant type capacitor in a circuit that needs a tight (narrow) capacitance

tolerance (e.g., a time-constant circuit), please carefully consider the temperature characteristics, and

carefully confirm the various characteristics in actual use conditions and the actual system.

[Example of Temperature Caracteristics X7R(R7)] [Example of Temperature Characteristics X5R(R6)]



-20

-10

-15

-5

Temperature (C)

-75 -50 -25 025 50 75 100 125 150

Capacitance Change(%)

-20

-10

-15

-5

Temperature (C)

-75 -50 -25 025 50 75 100

Capacitance Change(%)

JEMCGC-2701X 9

2.Measurement of Capacitance

1. Measure capacitance with the voltage and frequency specified in the product specifications.

1-1. The output voltage of the measuring equipment may decrease occasionally when capacitance is high.

Please confirm whether a prescribed measured voltage is impressed to the capacitor.

1-2. The capacitance values of high dielectric constant type capacitors change depending on the AC voltage applied.

Please consider the AC voltage characteristics when selecting a capacitor to be used in a AC circuit.

3.Applied Voltage

1. Do not apply a voltage to the capacitor that exceeds the rated voltage as called out in the specifications.

1-1. Applied voltage between the terminals of a capacitor shall be less than or equal to the rated voltage.

(1) When AC voltage is superimposed on DC voltage, the zero-to-peak voltage shall not exceed the rated DC voltage.

When AC voltage or pulse voltage is applied, the peak-to-peak voltage shall not exceed the rated DC voltage.

(2) Abnormal voltages (surge voltage, static electricity, pulse voltage, etc.) shall not exceed the rated DC voltage.

Typical Voltage Applied to the DC capacitor

DC Voltage DC Voltage+AC AC Voltage Pulse Voltage

(E：Maximum possible applied voltage.)

1-2. Influence of over voltage

Over voltage that is applied to the capacitor may result in an electrical short circuit caused by the breakdown

of the internal dielectric layers .

The time duration until breakdown depends on the applied voltage and the ambient temperature.

4.Type of Applied Voltage and Self-heating Temperature

1.Confirm the operating conditions to make sure that no large current is flowing into the capacitor due to the

continuous application of an AC voltage or pulse voltage.

When a DC rated voltage product is used in an AC voltage circuit or a pulse voltage circuit, the AC current

or pulse current will flow into the capacitor; therefore check the self-heating condition.

Please confirm the surface temperature of the capacitor so that the temperature remains within the upper limits

of the operating temperature, including the rise in temperature due to self-heating. When the capacitor is

used with a high-frequency voltage or pulse voltage, heat may be generated by dielectric loss.

1-1. The load should be contained to the level

　such that when measuring at atmospheric

　　temperature of 25°C, the product's self-heating

　　 remains below 20°C and the surface

temperature of the capacitor in the actual circuit

remains within the maximum operating

temperature.

Caution

100

0123

Current (Ar.m.s.) 456

Temperature Rise (C)

[Example of Temperature Rise (Heat Generation) in Chip

Monolithic Ceramic Capacitors in Contrast to Ripple Current]

Sample: R(R1) characteristics 10 Rated voltage: DC10V

Ripple Current

100kHz

500kHz

1MHz

JEMCGC-2701X 10

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Murata

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