
Battery Protection IC for 2-Serial
SGM41002 to 4-Serial-Cell Pack (Secondary Protection)
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ELECTRICAL CHARACTERISTICS
(TA= +25℃, unless otherwise noted.)
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
DETECTION VOLTAGE
Over-Charge Detection Voltage n
(n = 1, 2, 3, 4) VCUn
Test Circuit 1
SGM41002-4.35 4.314 4.35 4.386 V
SGM41002-4.45 4.414 4.45 4.486 V
SGM41002-4.5 4.464 4.5 4.536 V
Over-Charge Hysteresis Voltage n
(n = 1, 2, 3, 4)
VHCnTest Condition 1, Test Circuit 1 -0.422 -0.4 -0.378 V
INPUT VOLTAGE
Operating Voltage between VDD and VSS VDSOP 14 24 V
CTL Pin Input High Voltage VCTLH Test Condition 5, Test Circuit 2 VDD × 0.95 V
CTL Pin Input Low Voltage VCTLL Test Condition 5, Test Circuit 2 VDD × 0.4 V
INPUT CURRENT
Current Consumption During Operation IOPE V1 = V2 = V3 = V4 = 3.5V,
Test Condition 6, Test Circuit 3 2.4 3.5 μA
Current Consumption During Over-Discharge IOPED V1 = V2 = V3 = V4 = 2.3V,
Test Condition 6, Test Circuit 3 2.2 3 μA
VC1 Pin Current IVC1
V1 = V2 = V3 = V4 = 3.5V,
Test Condition 7, Test Circuit 4
0.6 1 μA
VC2 Pin Current IVC2 -0.5 0.005 0.5 μA
VC3 Pin Current IVC3 -0.5 0.005 0.5 μA
VC4 Pin Current IVC4 -0.5 0.005 0.5 μA
CTL Pin Input High Current ICTLH V1 = V2 = V3 = V4 = 3.5V,
VCTL = VDD, Test Condition 7,
Test Circuit 4 0.8 1.2 1.4 μA
CTL Pin Input Low Current ICTLL V1 = V2 = V3 = V4 = 3.5V,
VCTL = 0V, Test Condition 7,
Test Circuit 4 -0.5 0.5 μA
OUTPUT CURRENT
CO Pin Sink Current ICOL VCO = VSS + 0.5V,
Test Condition 8, Test Circuit 5 0.06 0.1 mA
CO Pin Source Current ICOH VCO = VDD - 0.5V,
Test Condition 8, Test Circuit 5 22 30 μA
DELAY TIME
Over-Charge Detection Delay Time tCU Test Condition 2, Test Circuit 1 1.5 2.8 4.1 s
Over-Charge Timer Reset Delay Time tTR Test Condition 3, Test Circuit 1 1.6 9.8 19.2 ms
Over-Charge Release Delay Time tCL Test Condition 2, Test Circuit 1 12.8 45.8 83.2 ms
CTL Pin Response Time tCTL Test Condition 4, Test Circuit 2 1.5 2.5 3.5 ms