Analog Devices EVAL-LTC7067-AZ Bedienungsanleitung
150V Dual High-Side MOSFET Gate
Driver
Rev 0; 6/23
© 2023 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners.
General Description
The EVAL-LTC7067-AZ features the LTC®7067 in a
flexible configuration as a non-synchronous step-down or
as a non-synchronous step-up converter. EVAL-LTC7067-
AZ also has a default set up to test LTC7067 only with a
load capacitor. As both Gate returns are floating, LTC7067
can be configured to drive dual-high side MOSFET, or to
drive high-side and low-side MOSFET. Typical
performance is shown in Table 1.
This demo board features LTC7067, 150V Dual high-side
MOSFET gate driver with overvoltage and undervoltage
protections in a 12-pin MSE package. Refer to the
LTC7067 data sheet for more detailed information.
Evaluation Circuit Photo
Table 1. Performance Summary (TA= 25C)
PARAMETER
CONDITIONS
MIN TYP MAX
UNITS
VIN_OPT
VCC = 10V
140
V
VCC
4.5 10 14
V
G1IN/G2IN
VCC = 10V
-0.3 5 6
V
G1 to G1RTN/G2 to G2RTN
VCC = 10V
9.4 9.6 9.8
V
G1IN/G2IN rising threshold
1.75
V
G1IN/G2IN falling threshold
0.5
V
Propagation delay
Rising
19
ns
Falling
21
Rise Time
VCC = 10V, CLOAD = 3.3nF
17
ns
Fall Time
15
ns
User Guide
EVAL-LTC7067-AZ
www.analog.com
Analog Devices | 2
Quick Start Procedure
Figure 1. Test Set up
Caution: Do not turn on the power supply until all connections are completed.
•Connect the power supply to VCC and GND.
•Connect one signal generator output to G1IN and GND, another to G2IN and GND. G1 and G2 can be tested altogether
or separately.
•Turn on the power supply and adjust it to 10V.
•Adjust the signal generator to a pulse waveform of 50% duty cycle, 0-5V, 200kHz, turn on the signal generator.
•Connect the probes of an oscilloscope to G1/G2 and GND, G1IN/G2IN and GND for waveforms measurement.
•Verify the G1/G2 amplitude is 9.6V and follow the G1IN/G2IN inputs duty cycle and frequency. Adjust the
frequency/duty cycle of G1IN/G2IN, expect the corresponding change of G1/G2.
Test with Default Load Capacitor
The board has a default set up to test the driver LTC7067 with load capacitors C5 and C6. The typical value of these
capacitors are 3.3nF. Typical waveforms of rising/falling time, propagation delays are below.
Figure 2. G1IN and G1 Rising, CLOAD = 3.3nF Figure 3. G2IN and G2 Rising, CLOAD = 3.3nF
150V Dual High-Side MOSFET Gate
Driver
EVAL-LTC7067-AZ
www.analog.com
Analog Devices | 3
Figure 4. G1IN and G1 Falling, CLOAD = 3.3nF Figure 5. G2IN and G2 Falling, CLOAD = 3.3nF
Figure 6. VCC Supply Current vs. PWM Inputs Frequency, VCC = 10V, CLOAD = 3.3nF
Figure 7. Thermal Picture at VCC =10V,Both G1 and G2 are running at 2MHz, CLOAD = 3.3nF, no forced air flow
150V Dual High-Side MOSFET Gate
Driver
EVAL-LTC7067-AZ
www.analog.com
Analog Devices | 4
Test in Non-synchronous Step-down Converter
The EVAL-LTC7067-AZ can be configured as a simple open-loop non-synchronous buck converter. To set up, populate
Q1, D3, and cut the copper on D3 to isolate the cathode of D3 from GND, Q1 will be the control MOSFET of buck, and
D3 will conduct the freewheeling inductor current when Q1 is off. Set the corresponding duty cycle and frequency of G1IN,
populate inductor across Q1 source to VOUT1, and simply short VIN_OPT to Q1 drain. Choose the output capacitors,
switching frequency, duty cycle, and sinking current by design. VOUT1 is the output. VIN_OPT is the input, to test EVAL-
LTC7067-AZ in a buck configuration, another power supply connected to VIN_OPT and GND is needed, choose input
capacitors by design. Note that the G1_RTN will see VIN_OPT voltage and G1VCC will see VIN_OPT+VCC-VDIODE,
where VDIODE
Figure 8
．
Test with Buck Converter Set up
Test in Non-synchronous Step-up Converter
The EVAL-LTC7067-AZ can be configured as a simple open-loop non-synchronous boost converter. To set up, populate
Q2, D2. Populate inductor from VIN to Q2 drain. Set the corresponding duty cycle and frequency of G2IN. Choose the
output capacitors, switching frequency, duty cycle, and sinking current by design. VOUT2 is the output. VIN_OPT is the
input, to test EVAL-LTC7067-AZ in a boost configuration, another power supply connected to VIN_OPT and GND is
needed, choose input capacitors by design.
FAULT
FAULT is an open drain output of an internal N-channel MOSFET, there is a pull-up resistor from FAULT to VCC on board.
FAULT will be pulled low during VCC UVLO/OVLO, typical VCC UVLO voltage is 4.3V, VCC OVLO voltage is 14.6V, or
over temperature (180C). After all the faults are cleared, FAULT will be pulled up to VCC.
150V Dual High-Side MOSFET Gate
Driver
EVAL-LTC7067-AZ
www.analog.com
Analog Devices | 5
EVAL-LTC7067-AZ Bill of Materials
ITEM
QTY
DESIGNATOR
DESCRIPTION
MANUFACTURER PART
NUMBER
REQUIRED CIRCUIT COMPONENTS
1
1
C1
CAP CER 1uF 16V 20% X5R
0402
MURATA
GRM155R61C105MA12D
2
1
C2
CAP CER 10uF 16V 10% X5R
0805
MURATA
GRM21BR61C106KE15L
3
2
C3,C4
CAP CER 1uF 16V 10% X7R
0603
AVX
0603YC105KAT2A2
4
2
C5,C6
CAP CER 3300PF 25V 10%
X7R 0603
WALSIN TECHNOLOGY
0603B332K250CT
5
2
D5,D6
DIO SCHOTTKY 150V 1A
SOD123HE AEC-Q101
ONSEMI
S115FP
6
1
R2
RES SMD 100K Ohm 1%
1/10W 0603 AEC-Q200
PANASONIC
ERJ-3EKF1003V
7
4
R5,R6,R7,R8
RES SMD 0 Ohm 0603 AEC-
Q200
VISHAY
CRCW0603000ZRT1
8
1
U1
IC-ADI 150V DUAL HIGH SIDE
MOSFET GATE DRIVER
ANALOG DEVICES
LTC7067RMSE#PBF
OPTIONAL CIRCUIT COMPONENTS
1
4
C7,C8,C9,C10
CAP CER 10UF 100V 10% X7S
1210
MURATA
GRM32EC72A106KE05L
2
4
C11,C12,C13,C14
CAP ALUM ELECT 47UF 100V
20% 12.5X13.5MM AEC-Q200
500MA 5000H
PANASONIC
EEV-FK2A470Q
3
2
D1,D2,D3,D4
DIODE SCHOTTKY TMBS 10A
150V SMP
VISHAY
V10PM15-M3/H
4
2
Q1,Q2
TRAN MOSFET N-CH 150V
56A 8LD TDSON EP
INFINEON TECHNOLOGIES
BSC160N15NS5ATMA1
HARDWARE FOR DEMO BOARD ONLY
1
11
TP1,TP2,TP3,TP4,TP5,TP6
,TP7,TP8,TP9,TP10,TP11
CONN-PCB SOLDER
TERMINAL TURRETS
MILL-MAX
2501-2-00-80-00-00-07-0
2
4
STANDOFF, BRD SPT SNAP
FIT 9.53MM LENGTH, EVAL
BOARD MTG
KEYSTONE
8832
150V Dual High-Side MOSFET Gate
Driver
EVAL-LTC7067-AZ
www.analog.com
Analog Devices | 6
EVAL-LTC7067-AZ Schematic
150V Dual High-Side MOSFET Gate
Driver
EVAL-LTC7067-AZ
Revision History
REVISION
NUMBER
REVISION
DATE
DESCRIPTION
PAGES
CHANGED
0
6/23
Initial release
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is
assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that
may result from its use. Specifications subject to change without notice. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the
property of their respective owners.
w w w . a n a l o g . c o m
Analog Devices | 7
150V Dual High-Side MOSFET Gate
Driver
EVAL-LTC7067-AZ
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