AFM Workshop TT-AFM Bedienungsanleitung

TT-AFM

Users

Guide

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AFM

Wo'~op

Part # 10-4172-10

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•Definitions and Symbols

The following terms and symbols are used

~his

document and also appear

the product where safety-related

issues occur. .

•General Warning or Caution

•

• The exclamation symbol may appear

warning and caution tables

this document. This symbol designates

•

· area where personal injury or damage

the equipment

possible.

•

• European Union

Mark

• (E

The presence of the

Mark

AFM Workshop equipment means that it has been designed, tested and

certified

complying with all applicable European Union (CE) regulations and recommendations.

• Warnings/Cautions/Notes

The following are definitions of the warnings, cautions and notes that may

used

this manual to call attention

to important information regarding personal safety, safety and preservation of the equipment, or important tips.

WARNING

Situation has the potential to cause bodily harm or death.

•

•CAUTION

Situation has the potential to cause damage

property

equipment.

• NOTE

Additional information the user or operator should consider.

•

-•

•

-'-

Contents

Introduction

Atomic Force

Microscopy':

Introduction

the TT-AFM

2.1. Computer

2.2. Stage

2.3. EBox

2.4. Video Optical Microscope

Software

3.1. Loading Software

3.2. AFM-View Software

3.2.1. Pre-Scan Window

3.2.1.1. Files

3.2.1.2. Modes

3.2.1.3. Laser Align

3.2.1.4. Tune Frequency

3.2.1.5. Manual Z Motor Control

3.2.1.6. Range Check

3.2.1.7. Automated Tip Approach

3.2.2. Scan Window

3.2.2.1. Image Window

3.2.2.2. Oscilloscope Window

3.2.2.3 Scan Setup

3.2.2.4. Z Feedback

3.2.2.5. Display

3.2.2.6. Tip Retract

3.2.2.7. Control

3.2.3. System Window

3.2.3.1. Z Noise

3.2.3.2. Z High Voltage Gain

3.2.3.3. Xyz Calibration

3.3.

Virleo-View

Software

Measuring Images With the TT-AFM

4.1. Operating the Video Microscope

4.2. Exchanging Samples

4.3. Exchanging Probes

4.4. Aligning the Light Lever Force Sensor

4.5. Optical Assisted Tip Approach

4.6. Contact Mode Imaging

4.7. Vibrating Mode Imaging

Appendix

Setting Up the TT-AFM

A.1. Selecting a Location

A.2. Setting

the Optical Microscope

A.3. Connecting the TT-AFM

the Cables

A.4. System Check

A.5. Aligning the Video and TT-AFM Microscopes

A.6. First Alignment

the Light Lever

A.7. Installing

Xyz Piezoelectric Scanner

Page

•

Appendix

TT-AFM Files

B.1.

Parameter Files

B.2. Scanner Files

•

B.3. Data Files

Appendix

Calibration

, Appendix

Probes

Appendix

Technical Information

E.1. Electronic Bock Diagrams

E.2. EBox and Modes

Assignments

•E.3. Sample and Probe Holder Mechanical Drawings

•

Appendix

Optimizing GPID Parameters

•

Page

•

Introduction

Atomic Force Microscopy

•

AFM (atomic force microscope), a probe.

scanned over a

surface and the motion of the probe

monitored

create a three-

dimensional image of the

surfac~.

Such microscopes are capable of

measuring surface features of only a few nanometers

size. These

unique instruments are capable of measuring high-resolution images

ambient air and liquids.

The three-dimensional motion of the probe (or sample)

generated

with piezoelectric ceramics. With the piezoelectric ceramics, motions

small

a fraction of a nanometer are possible. Typically the

sample (or probe)

moved

a raster pattern

the probe glides

across the surface.

A light lever sensor

used for controlling the force of the probe

the surface while the sample

scanned. The light lever reflects a

laser beam off the surface of a cantilever into a photodetector.

the

probe

interacts with a surface, the cantilever deflects and the motion

sensed with the photodetector.

With this light lever, forces

small

a pica-newton are possible.

With such small forces, very small probes may

used. With micro-

machining methods, probes

can

have diameters of only a few

nanometers.

The light lever

can

made more sensitive by vibrating the

cantilever with a small piezoelectric ceramic and modulating the light.

When the vibrating probe interacts with the surface, the amplitude of

vibration may

monitored and used to control the probe's force

the surface.

Modern atomic force microscopes include not only a probe and

piezoelectric scanner, but additional hardware for bringing the probe

rapidly

Into

me proximity of a surface. A video optical microscope IS

very helpful for operating

AFM. The video microscope helps with

aligning the light lever and probe approach and for fining features for

scanning.

For

in-depth description ofAFM instrumentation, we recommend

the book Atomic Force Microscopy by Peter Eaton and Paul West.

This book provides a complete

theoretical-as

well

practical-

explanation for the design and application of

AFM.

•

Page

Detector

ATOMIC

FORCE

MICROSCOPY

PETER EATON

PAUL

'NEST

•

Introduction

the

TT-AFM

When fully assembled, the TT-AFM comprises four sub-units. They are

• the control computer, the EBox, the stage and the video optical

microscope.

2.1.

Computer

The control computer

a standard IBM/PC-type computer with a

Microsoft Windows operating system. There are two programs required

to operate the TT-AFM: the first

the AFM control software and the

second

the software for the color

CCO

camera.

2.2. Stage

Samples are held and scanned

the AFM stage.

the upright inside

the stage

a linear translator which moves the LL-AFM sensor

•

t»

vertical direction. Also

the stage

the light lever force sensor,

precision x-y stage and the piezoelectric scanner. Samples are held

magnetically

diameter plate at the top ofthe piezoelectric

scanner.

•Optimal images

are

measured with the AFM stage if it

a vibration-

and acoustic-free environment. If necessary, a vibration and acoustic

"isolation system should

used. Appendix A provides more information

on the best location for the

AFM

stage.

•

At the front left of the stage

a "modes" connector. Signals reqUired for

implementing additional modes such

conductive AFM, STM and

EFM are provided. Additional information

the cable configuration

provided

Appendix

2.3.

EBox

The EBox sends and receives signals from the computer through a

single USB cable. Electronic signals are then sent to the stage trough a

60-pin ribbon cable. Additionally, a grounding cable

connected

between the stage and the EBox. All cables are connected at the rear

lilt::

CDUX.

Dt::siues [he coole

[he stage, there is a plug for an

auxiliary 50-pin cable that gives access

the EBox's internal electronic

signals. Appendix C provides additional information regarding the

cables.

2.4.

Video

Optical

Microscope

Aligning the light lever force sensor

greatly facilitated

the

aid

the video optical microscope. Also, the video microscope

can

help

locate features

a surface for scanning. Finally, a tip approach

can

undertaken much more rapidly with the aid of the video microscope.

Images from the video microscope are displayed

a computers' video

monitor.

•

Page

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Figure 2.1. TT-AFM stage combined

with the video microscope

rear

mode

FigtJre

2 2 Front view ofthe TT-AFM

EBox showing the indicator lights

Figure 2.3. Video microscope

•

Page

•

• 3. Software

•The TT-AFM includes three separate software. modules

a USB memory stick.

,'.

3.1. Loading Software

• Video Microscope Software:

Plug USB memory stick into

the

computer and open the folder "CCO camera." The contents of the folder are:

Copy the folder "RZ300C"

the computer desktop.

Plug USB cable into the camera.

When prompted, load the camera driver from the memory stick.

Open folder

and

click

"RZS300C"

launch the program.

AFM Workshop Acquisition Software:

Plug USB memory stick into the computer.

Copy the contents of the folder "AFMWorkshop" to the desktop.

Once

the desktop, open the folder "AFMWorkshop"

and

select "setup.exe."

d) Follow the installation instructions.

•

I Gwyddion Image Analysis Software:

Gwyddion

open-source software

and

the latest version ofthis image-analysis software

available

the

I Internet

at:

http://gwyddion.net/.

Additionally, there

a directory

the USB memory stick named "Gwyddion." The contents ofthe file are:

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Launch

and

install the GK2.12.9 -win32 software.

Launch

and

install the Gwyddion 2.xx software.

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3.2.1. Pre-Scan

Window

The "Pre-Scan" window has

all

of the functions that are

required before

image

measured.

this window, when

a function

being used

appears with a green frame.

3.2.1.1. Files

Two files are required

operate the AFM-View software.

•

The "Parameter File" has parameters that are used

operate the microscope. The "Scanner File" has calibration

parameters for a specific scanner. Upon launching the AFM-

View software, default files are loaded into the software.

Changing the files used

the program

possible with the

"File" buttons. Also, these files may

edited to change

parameters with a text editor such

Notepad. Appendix

lists the contents of both the configuration and scanner file.

•

t·

Page

3.2. AFM-View Software

Once launched, the AFM-View software has three screens that can

viewed

pressing the tabs at the top

right-hand side ofthe screen. The first tab

for the "Pre-Scan" window and the second tab

for the "Scan"

window. These two windows are pll that

are

needed for measuring AFM images. The third tab labeled "System"

used for several functions such

measuring the Z noise floor and xyz scanner calibration.

•

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Page

3.2.1.2. Modes

There are two TT-AFM modes: "Contact" and "Vibrating."

The modes are selected by the "Scan Mode" button.

When "Vibrating" mode

selected, the frequency sweep

window

activated.

3.2.1.3. Laser Align

The position of the laser

the four-quadrant

• photodetector

presented numerically and visually with

the "LaserAlign" window. These two indicators are both

updated

real time and are used for aligning the light

lever

the force sensor. There

a switch for turning the

laser "On" and "Off."

•

• Note: After the TT-AFM light lever

set up

~,.

for the first time, the thumb screws used for

laser alignment do not need

turned

more than a few turns.

• 3.2.1.4. Tune Frequency

The "Tune Frequency" window

used for selecting the

optimal conditions for making "Vibrating" mode images.

There are several controls

the window. They are:

"Amplitude"

"Phase"

"Lower" frequency

"Selected" frequency

"Upper" frequency

There are two oscilloscope windows

the "Tune

Frequency" window. One shows the amplitude of the

probe's vibration

and

the other shows the phase

between the drive frequency

and

the measured

frequency.

•

Page

3.2.1.5. Manual Z Motor Control

The Z motor, which raises

and

lowers the LL-AFM sensor

and

down,

activated with this window. The speed of

the motion can

controlled with the speed slider. When

the "Up" and "Down" buttons are held down, the motor

slews. The motor

jogged

touching the "Up" and

"Down" buttons.

•

• Caution: Before activating the "Range Check"

function make sure that the probe

moved

away from the sample surface. If the probe

too close to the surface, the probe may

broken.

3.2.1.6. Range Check

The usable range of the piezoelectric scanner is measured

with the "Range Check" option. When "Started," the

piezoelectric scanner

moved

a square motion which

can

readily observed with the video optical microscope.

Caution: Always visually monitor the position of

the Z motor. The Z motor

can

drive the

cantilever into the xyz piezoelectric scanner

and

damage both the probe holder and the

scanner.

•

3.2.1.7. Automated Tip Approach

The "Automated

Tip

Approach" button starts the process of

the probe moving toward the surface. A woodpecker motion

used, which results

noticeable clicking sounds from the

microscope stage. This sound

from two sources: the

stepper motor being energized and the Z piezoelectric

ceramic being retracted.

•

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