ICSPI NGauge Bedienungsanleitung

nGauge Atomic Force Microscope

User Manual Version 2.0

For Software and Firmware versions 1.0.0.0

 
 
© ICSPI Corp. 2007-2021 nGauge AFM User Manual 2.0 2 
 
Table of Contents 
Introduction..........................................................................................................................4
Safety and Precautions........................................................................................................4
Overview..............................................................................................................................7
1. AFM Basics...................................................................................................................7
2. MEMS AFM or AFM-on-a-Chip.....................................................................................7
3. nGauge AFM Components ...........................................................................................8
4. nGauge AFM Capabilities.............................................................................................8
Setup.................................................................................................................................10 
1. Location......................................................................................................................10
2. Basic Set-up ...............................................................................................................11
3. Software Installation....................................................................................................12 
Basic Operation .................................................................................................................13
1. Start-up.......................................................................................................................13
2. Chip Installation and Sample Placement.....................................................................14
3. Software Overview......................................................................................................17
4. Sweep.........................................................................................................................17 
5. Approach ....................................................................................................................19
6. Scan ...........................................................................................................................23
7. Scanning Recommendations ......................................................................................29 
8. Improving Performance...............................................................................................33 
9. Advanced Scan Features............................................................................................36 
Post-Processing.................................................................................................................38 
1. Gwyddion....................................................................................................................39
2. Calibration...................................................................................................................40
Troubleshooting.................................................................................................................42 
1. Set-up Troubleshooting...............................................................................................42 
2. Sweep Troubleshooting ..............................................................................................44
3. Approach Troubleshooting..........................................................................................48
4. Scan Troubleshooting.................................................................................................52
Advanced Controls.............................................................................................................55
1. Sweep Advanced Controls..........................................................................................55
2. Approach Advanced Controls......................................................................................57 

8.3. Menu Button Advanced Controls.................................................................................58

9. Appendix............................................................................................................................61

9.1. Gwyddion Supplement................................................................................................61

1.Introduction

Congratulations on purchasing an nGauge Atomic Force Microscope!

The nGauge AFM achieves magnification that far surpasses that of an optical microscope so

you can explore the world with nanometer-scale resolution.

The most up-to-date user manual can be downloaded from the ICSPI website at

https://www.icspicorp.com/resources

Please read the user manual before operating your new instrument to learn how it works, how to

set up and operate the hardware and software, how to prepare samples, and how to visualize

your data.

2.Safety and Precautions

The following warnings and precautions should be observed to ensure the safety of the user

and the instrument:

•Use only the power supply provided. The driving electronics are designed to accept

7.5 V (DC) and an internal fuse prevents the input current from exceeding 1 A.

•The stage contains moving parts that could pinch. To avoid minor injury, be aware of

the moving parts.

•Do not disassemble the system. Except for sample platform customization,

disassembly of the system voids the warranty and could result in damage to the

electronics or the mechanical components.

•Be extremely careful when handling an AFM chip. They are very fragile and will

break if the tip is touched. AFM chips should be stored in their box with the tip facing

DOWN and removed using the tweezers provided. If necessary, the AFM chip can be

placed on a flat surface with the tip facing up. The AFM chip can be picked up by hand

by the board as long as you are careful to avoid touching the tip.

The tip, located at the edge of the

board, is extremely fragile.

AFM chips should be stored with the

tip facing down in the storage box.

Use tweezers to pick them up.

The AFM chip can be placed on a

flat surface with the tip facing up.

The AFM chip can be picked up by

hand as long as you don't touch the

tip.

This is a zoomed-in photo of the

AFM chip. The chip is extremely

fragile.

Sample should not move during scanning

Make sure that the sample is stable and will

not move during scanning.

Lightweight samples should be mounted

onto a rigid substrate like a glass slide or

metal disc.

Keep the chip a safe distance from the sample

When installing or removing a chip, make

sure that there is at least 5 mm of space

between the tip and the sample.

To retract the tip in the software, go to the

Approach page and click and hold the

Retract button.

Probe tip is susceptible to damage when engaged

Do not touch the sample, chip or unit when

the tip is approaching or in contact with the

sample. The probe tip is susceptible to

damage when approaching or engaged.

Minimize contact between tip and sample

Minimize the amount of time that the tip is

contact with the sample. When you are

finished scanning, navigate to the Approach

page:

1. Click on Disengage.

2. Wait for the button to indicate Retract.

3. Click and hold on Retract until the tip is

at least 5 mm away from the sample (about

10 seconds).

DISENGAGE

RETRACT

3. Overview

3.1. AFM Basics

Unlike optical microscopes that use light and lenses to magnify, or electron microscopes which

use electron beams to generate an image, an atomic force microscope (AFM) uses a very sharp

tip to scan across the surface of a sample. AFM measures tip-sample interaction forces and

generates a 3D reconstruction of a sample surface.

This scan moves in X and in Y. It moves quickly from left to right (in the X direction, also known

as the fast scan axis), then moves backwards (reverses), and moves down to the next row (Y

direction) in the slow scan axis. The pattern is known as a raster scan.

A controller maintains a constant tip-sample force by adjusting the tip's Z height. The control

effort then represents the height of the features on the sample.

Conventional AFMs typically use a probe with a sharp tip on a silicon cantilever. A laser beam is

reflected off the backside of the cantilever onto a photodetector that measures any small

displacements of the cantilever. A piezoelectric Z-scanner controls the height of the probe while

a piezoelectric XY stage raster scans the sample in X and Y.

3.2. MEMS AFM or AFM-on-a-Chip

MEMS AFM or AFM-on-a-chip operates almost exactly like a conventional AFM except that all

of the essential components are integrated onto a single chip. The nGauge AFM chip is a micro

-electro-mechanical systems (MEMS) device that uses the most advanced manufacturing

process in the world to produce tiny, ultra-precise scanners and sensors on a 1 mm x 1 mm

silicon chip.

An AFM on a chip has a cantilever and a sharp tip but instead of a laser it has an integrated

piezoresistive strain sensor to measure tip displacements. The tip and sensor are attached to a

MEMS scanner that can position them in X, Y, and Z with sub-nanometer resolution.

3.3. nGauge AFM Components

The nGauge AFM system includes all of the following components. A computer (not included)

with a USB port is required and access to a power outlet.

1. Stage

2. Sample Platform

3. Thumb Nut

4. AFM Chips

5. Power Supply

6. USB Cable

7. Tweezers

3.3.1. Detachable Sample Platform

nGauge AFM models 1.1 and 1.2 feature a detachable sample platform. These screws are

removable, and the stage can be customized.

3.3.2. Hole in base plate

The base plate features a hole for mounting the nGauge AFM onto an optical table.

3.4. nGauge AFM Capabilities

3.4.1. Scan Mode

The nGauge AFM operates in tapping mode (also known as intermittent contact or dynamic

mode): the cantilever oscillates at its resonant frequency and makes intermittent contact or

“taps” the sample surface.

The nGauge AFM uses the amplitude of oscillation as the feedback mechanism, also known as

amplitude-modulation AFM (AM-AFM) mode.

The nGauge generates topography, phase and error images simultaneously.

3.4.2. Scan Operation Environment

The nGauge AFM is designed to operate in ambient environment (normal room temperature

and pressure).

3.4.3. Scan Size

The nGauge AFM can scan areas of up to 20 µm x 20 µm in X and Y, up to 60 µm in X and

vertical distances up to 10 µm in Z (peak-to-valley) with <1 nm RMS noise in the vertical

direction.

3.4.4. Sample Types

Any solid sample can be imaged, including both conductive and non-conductive, but the

nGauge AFM cannot operate in liquid and cannot image liquid samples.

Some samples that are prone to surface charging, such as highly electrically resistive polymers,

may require a way to mitigate surface charging.

The maximum sample size for the normal sample platform is 100 mm × 50 mm × 16 mm

L×W×H.

The maximum sample weight is 1 kg.

4.Setup

4.1. Location

The nGauge AFM is small, simple, and portable, and can be set up virtually anywhere. For best

results, it is recommended that you follow these guidelines:

Normal

temperature

and pressure

The nGauge system should be set up in areas with normal room

temperature and pressure.

Flat surface

The nGauge system should be set up on a flat, level surface, like a desk or

tabletop, with enough space to ensure that the stage does not get bumped

or moved while imaging.

Vibrations

The unique design of the nGauge AFM minimizes the effects of common

sources of low-frequency vibrations, such as those caused by people

walking by, doors opening and closing, and building vibrations. However, it is

best to set the system up on a solid, stable surface away from as many

sources of vibration as possible. The corner of a room is a good choice.

Air drafts

The system is not immune to air drafts and should be set up away from air

vents, drafty windows, etc. If possible, set up the nGauge AFM in the corner

of a room or near a wall where there is less air flow. If air drafts are

unavoidable and present a significant problem, a box or enclosure around

the system may be required.

Electrical

noise

The system meets the FCC guidelines for electrical interference, but it is

best to avoid setting it up near sources of electrical noise, such as server

rooms or rooms operating high-power equipment.

Inhaltsverzeichnis

Andere ICSPI Mikroskop Handbücher

ICSPI

ICSPI nGauge AFM Bedienungsanleitung

Beliebte Mikroskop Handbücher anderer Marken

Thermo Scientific

Thermo Scientific Nicolet iN10 Leitfaden

National

National DC3-163 Bedienungsanleitung

KERN Optics

KERN Optics OPE-1 Bedienungsanleitung

OPTIKA MICROSCOPES

OPTIKA MICROSCOPES B-150D Bedienungsanleitung

Prior

Prior Lux POL Bedienungsanleitung

Opitec

Opitec Smartscoop 115615 Bedienungsanleitung

KERN

KERN OPO-1 Bedienungsanleitung

Topcon

Topcon SP-1P Bedienungsanleitung

Motic

Motic PA43 Bedienungsanleitung

Leica

Leica DVM5000 Benutzerhandbuch

MshOt

MshOt MZ62 Bedienungsanleitung

KERN Optics

KERN Optics OZR-5 Bedienungsanleitung

VWR

VWR VisiScope 384 Series Bedienungsanleitung

Nikon

Nikon ECLIPSE E200 POL Bedienungsanleitung

Leica

Leica DI C800 Handbuch

ThermoFisher Scientific

ThermoFisher Scientific Continuµm Bedienungsanleitung

ThermoFisher Scientific

ThermoFisher Scientific Continuµm Bedienungsanleitung

Olympus

Olympus SZ61 Bedienungsanleitung

ICSPI nGauge Bedienungsanleitung

Beliebte Mikroskop Handbücher anderer Marken