Agilent Technologies E1420B Bedienungsanleitung

Agilent Technologies

Agilent E5505A

Phase Noise

Measurement System

User’s Guide

First edition, June 2004

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Manual Part Number

E5505--90003

Edition

First edition, June 2004

Printed in USA

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Agilent E5505A User’s Guide 3

Contents

1 Getting Started

Introduction 26

Documentation Map 27

Table 1. E5505A user’s guide map 27

Additional Documentation 28

Figure 1. Navigate to system documentation 28

System Overview 29

Figure 2. E5505A benchtop system, typical configuration 30

Table 2. Equivalent system/instrument model numbers 30

2 Introduction and Measurement

Introducing the GUI 32

Figure 3. E5500 graphical user interface (GUI) 33

Designing to Meet Your Needs 34

Beginning 34

E5505A Operation: A Guided Tour 35

Required equipment 35

How to begin 35

Powering the System On 36

To power on a racked system 36

To power on a benchtop system 36

Starting the Measurement Software 37

Figure 4. Navigation to the E5500 user interface 37

Figure 5. Phase noise measurement subsystem main screen 38

Performing a Confidence Test 39

Figure 6. Opening the file containing pre-stored parameters 39

Figure 7. Navigating to the Define Measurement window 40

Beginning a measurement 40

Figure 8. Navigating to the New Measurement window 40

Figure 9. Confirm new measurement 41

Figure 10. Setup diagram displayed during the confidence test. 41

Figure 11. Connect diagram example 42

Making a measurement 42

Figure 12.Typical phase noise curve for test set confidence test 43

Sweep segments 43

4Agilent E5505A User’s Guide

Congratulations 43

Learning more 44

Table 3. Parameter data for the N5500A confidence test example 44

Powering the System Off 45

To power off a racked system 45

To power off a benchtop system 45

Using the E5500 Shutdown Utility 45

Figure 13. Shutdown utility icon 45

3PhaseNoiseBasics

What is Phase Noise? 48

Figure 14. RF sideband spectrum 49

Phase terms 49

Figure 15. CW signal sidebands viewed in the frequency domain 50

Figure 16. Deriving L(f) from a RF analyzer display 51

Figure 17. L(f) Described Logarithmically as a Function of Offset Frequency 51

Figure 18. Region of validity of L(f) 52

4 Expanding Your Measurement Experience

Starting the Measurement Software 54

Figure 19. Navigate to E5500 user interface 54

Using the Asset Manager 55

Configuring an asset 55

Figure 20. Navigate to Asset Manager 55

Figure 21. Navigate to Add in Asset Manager 56

Figure 22. Select source as asset type 56

Figure 23. Choose source 57

Figure 24. Select I/O library 57

Figure 25. Enter asset and serial number 58

Figure 26. Enter comment 58

Figure 27. Click check-mark button 59

Figure 28. Confirmation message 59

Using the Server Hardware Connections to Specify the Source 60

Figure 29. Navigate to server hardware connections 60

Figure 30. Select Sources tab 60

Figure 31. Successful I/O check 61

Figure 32. Failed I/O check 61

Setting GPIB Addresses 63

Table 4. Default GPIB addresses 63

Agilent E5505A User’s Guide 5

Figure 33. Asset Manager on System menu 64

Figure 34. Asset Manager window 64

Figure 35. GPIB address dialog box 65

Testing the 8663A Internal/External 10 MHz 66

Required equipment 66

Defining the measurement 66

Figure 36. Select the parameters definition file 66

Figure 37. Enter Source Information 67

Table 5.Tuning characteristics for various sources 68

Selecting a reference source 68

Figure 38. Selecting a reference source 68

Selecting loop suppression verification 69

Figure 39. Selecting loop suppression verification 69

Setting up for the 8663A 10 MHz measurement 69

Figure 40. Noise floor for the 8663 10 MHz measurement 70

Figure 41. Noise floor example 70

Beginning the measurement 71

Figure 42. Selecting new measurement 71

Figure 43. Confirm new measurement 71

Figure 44. Connection diagram 72

Table 6.Test set signal input limits and characteristics 73

Sweep segments 75

Figure 45. Oscilloscope display of beatnote from test set monitor port 76

Making the measurement 76

Figure 46. Selecting suppression 77

Figure 47. Typical phase noise curve for an 8663A 10 MHz measurement 78

Table 7. Parameter data for the 8663A 10 MHz measurement 79

Testing the 8644B Internal/External 10 MHz 81

Required equipment 81

Defining the measurement 81

Figure 48. Select the parameters definition file 81

Figure 49. Sources tab in define measurement window 82

Table 8.Tuning characteristics for various sources 83

Selecting a reference source 83

Figure 50. Selecting a reference source 84

Selecting loop suppression verification 84

Figure 51. Selecting loop suppression verification 85

Setting up the 8663A 10 MHz measurement 85

Figure 52. Noise floor for the 8644B 10 MHz measurement 85

Figure 53. Noise floor example 86

Beginning the measurement 87

6Agilent E5505A User’s Guide

Figure 54. Selecting a new measurement 87

Figure 55. Confirm measurement dialog box 87

Figure 56. Connect diagram dialog box 88

Table 9.Test set signal input limits and characteristics 89

Figure 57. Oscilloscope display of beatnote from test set monitor port 91

Making the measurement 92

Figure 58. Suppression selections 92

Figure 59. Typical phase noise curve for an 8644B 10 MHz measurement. 93

Table 10. Parameter data for the 8644B 10 MHz measurement 94

Viewing Markers 96

Figure 60. Navigate to markers 96

Figure 61. Adding and deleting markers 96

Omitting Spurs 97

Figure 62. Navigate to display preferences 97

Figure 63. Uncheck spurs 97

Figure 64. Graph displayed without spurs 98

Displaying the Parameter Summary 99

Figure 65. Navigate to parameter summary 99

Figure 66. Parameter summary 100

Exporting Measurement Results 101

Figure 67. Export results choices 101

Exporting Trace Data 102

Figure 68.Trace data results 102

Exporting spur data 103

Figure 69. Spur data results 103

Exporting X-Y data 104

Figure 70. X-Y data results 104

5 Absolute Measurement Fundamentals

The Phase-Lock-Loop Technique 106

Understanding the Phase-Lock-Loop Technique 106

Figure 71. Simplified block diagram of the phase lock loop configuration 106

The Phase-Lock-Loop Circuit 106

Figure 72. Capture and drift-tracking range with tuning range of VCO 107

Figure 73. Capture and drift-tracking ranges and beatnote frequency 108

What Sets the Measurement Noise Floor? 110

The System Noise Floor 110

Table 11. Amplitude ranges for L and R ports 110

Figure 74. Relationship between the R input level and system noise floor 110

Agilent E5505A User’s Guide 7

The Noise Level of the Reference Source 111

Figure 75. Reference source noise approaches DUT noise 111

Selecting a Reference 112

Figure 76. DUT noise approaches reference noise 112

Using a Similar Device 112

Using a Signal Generator 113

Tuning Requirements 113

Table 12. Tuning Characteristics of Various VCO Source Options 113

Figure 77.Voltage tuning range limits relative to center voltage of the VCO tuning

curve 114

Estimating the Tuning Constant 115

Table 13. VCO tuning constant calibration method 115

Tracking Frequency Drift 116

Evaluating beatnote drift 116

Changing the PTR 118

Figure 78. Peak tuning range 118

The Tuning Qualifications 118

Minimizing Injection Locking 120

Adding Isolation 120

Increasing the PLL Bandwidth 120

Figure 79. Peak tuning range (PTR) Required by injection locking. 121

Inserting a Device 122

An attenuator 122

Figure 80. Measurement noise floor relative to R-Port signal level 122

An amplifier 123

Figure 81. Measurement noise floor as a result of an added attenuator 123

Evaluating Noise Above the Small Angle Line 124

Determining the Phase-Lock-Loop bandwidth 124

Figure 82. Phase lock loop bandwidth provided by the peak tuning range 125

Figure 83. Graph of small angle line and spur limit 126

Figure 84. Requirements for noise exceeding small angle limit 127

6 Absolute Measurement Examples

Stable RF Oscillator 130

Required equipment 130

Defining the measurement 130

Figure 85. Select the parameters definition file 130

Figure 86. Enter source information 131

Table 14.Tuning characteristics for various sources 132

8Agilent E5505A User’s Guide

Selecting a reference source 132

Figure 87. Selecting a reference source 133

Selecting Loop Suppression Verification 133

Figure 88. Selecting loop suppression verification 134

Setup considerations for stable RF oscillator measurement 134

Figure 89. Noise floor for the stable RF oscillator measurement 135

Figure 90. Noise floor calculation example 135

Beginning the measurement 136

Figure 91. Selecting a new measurement 136

Figure 92. Confirm new measurement 136

Figure 93. Connect diagram for the stable RF oscillator measurement 137

Table 15.Test set signal input limits and characteristics 138

Checking the beatnote 139

Figure 94. Oscilloscope display of beatnote from test set Monitor port 140

Making the measurement 140

Figure 95. Selecting suppressions 141

Figure 96.Typical phase noise curve for a stable RF oscillator 142

Table 16. Parameter data for the stable RF oscillator measurement 143

Free-Running RF Oscillator 145

Required equipment 145

Defining the measurement 145

Figure 97. Select the parameters definition file 146

Figure 98. Enter source information 147

Table 17.Tuning characteristics for various sources 147

Selecting a reference source 148

Figure 99. Selecting a reference source 148

Selecting Loop Suppression Verification 148

Figure 100. Selecting loop suppression verification 149

Setup considerations for the free-running RF oscillator measurement 149

Figure 101. Noise floor for the free-running RF oscillator measurement 150

Figure 102. Noise floor calculation example 150

Beginning the measurement 151

Figure 103. Selecting a new measurement 151

Figure 104. Confirm measurement dialog box 151

Figure 105. Connect diagram for the free-running RF oscillator measurement 152

Table 18.Test set signal input limits and characteristics 153

Checking the beatnote 153

Figure 106. Oscilloscope display of beatnote from test set Monitor port 154

Making the measurement 155

Figure 107. Selecting suppressions 156

Figure 108.Typical phase noise curve for a free-running RF oscillator 157

Agilent E5505A User’s Guide 9

Table 19. Parameter data for the free-running RF oscillator measurement 158

RF Synthesizer Using DCFM 160

Required equipment 160

Defining the measurement 160

Figure 109. Select the parameters definition file 160

Figure 110. Enter source information 161

Table 20.Tuning characteristics for various sources 162

Selecting a reference source 162

Figure 111. Selecting a reference source 162

Selecting Loop Suppression Verification 163

Figure 112. Selecting loop suppression verification 163

Setup considerations for the RF synthesizer using DCFM measurement 163

Figure 113. Noise floor for the RF synthesizer (DCFM) measurement 164

Figure 114. Noise floor calculation example 164

Beginning the measurement 165

Figure 115. Selecting a new measurement 165

Figure 116. Confirm measurement dialog box 165

Figure 117. Connect diagram for the RF synthesizer (DCFM) measurement 166

Table 21.Test set signal input limits and characteristics 167

Checking the beatnote 167

Figure 118. Oscilloscope display of beatnote from the test set Monitor port 168

Making the measurement 169

Figure 119. Selecting suppressions 169

Figure 120.Typical phase noise curve for an RF synthesizer using DCFM 170

Table 22. Parameter Data for the RF Synthesizer (DCFM) Measurement 171

RF Synthesizer Using EFC 173

Required equipment 173

Defining the measurement 173

Figure 121. Select the parameters definition file 173

Figure 122. Enter Source Information 175

Table 23.Tuning Characteristics for Various Sources 175

Selecting a reference source 176

Figure 123. Selecting a reference source 176

Selecting Loop Suppression Verification 176

Figure 124. Selecting Loop suppression verification 177

Setup considerations for the RF synthesizer using EFC measurement 177

Figure 125. Noise floor for the RF synthesizer (EFC) measurement 178

Figure 126. Noise floor calculation example 178

Beginning the measurement 179

Figure 127. Selecting a new measurement 179

Figure 128. Confirm measurement dialog box 179

10 Agilent E5505A User’s Guide

Figure 129. Connect diagram for the RF synthesizer (EFC) measurement 180

Table 24. Test set signal Input Limits and Characteristics 181

Checking the beatnote 181

Figure 130. Oscilloscope display of a beatnote from the test set Monitor port 182

Making the measurement 182

Figure 131. Selecting suppressions 183

Figure 132.Typical phase noise curve for an RF synthesizer using EFC 184

Table 25. Parameter data for the RF synthesizer (EFC) measurement 185

Microwave Source 187

Required equipment 187

Defining the measurement 187

Figure 133. Select the parameters definition file 187

Figure 134. Enter source information 189

Table 26.Tuning characteristics for various sources 189

Selecting a reference source 190

Figure 135. Selecting a reference source 190

Selecting Loop Suppression Verification 190

Figure 136. Selecting loop suppression verification 191

Setup considerations for the microwave source measurement 191

Figure 137. Noise characteristics for the microwave measurement 191

Beginning the measurement 192

Figure 138. Selecting a new measurement 192

Figure 139. Confirm measurement dialog box 192

Figure 140. Connect diagram for the microwave source measurement 193

Table 27.Test set signal input limits and characteristics 194

Checking the beatnote 194

Figure 141. Oscilloscope display of a beatnote from the test set Monitor port 195

Making the measurement 196

Figure 142. Selecting suppressions 197

Figure 143.Typical phase noise curve for a microwave source 198

Table 28. Parameter data for the microwave source measurement 199

7 Residual Measurement Fundamentals

What is Residual Noise? 202

The noise mechanisms 202

Figure 144. Additive noise components 202

Figure 145. Multiplicative noise components 203

Assumptions about Residual Phase Noise Measurements 204

Figure 146. Setup for typical residual phase noise measurement 204

Frequency translation devices 205

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